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中文
Amorphous SiO
2
/Si Interface Defects and Mechanism of Passivation/Depassivation Reaction
Hong Zhuocheng, Zuo Xu
Journal of System Simulation . 2020, (
12
): 2362 -2375 . DOI: 10.16182/j.issn1004731x.joss.20-FZ0474E