基于非完美调试和测试工作量的软件可靠性研究

doi:10.16182/j.issn1004731x.joss.201807020

系统仿真学报 ›› 2018, Vol. 30 ›› Issue (7): 2593-2599.doi: 10.16182/j.issn1004731x.joss.201807020

基于非完美调试和测试工作量的软件可靠性研究

王爱珍¹, 吕勋²

1. 忻州师范学院,山西忻州 034000;
2. 哈尔滨工程大学,黑龙江哈尔滨 150001

收稿日期:2017-05-17 出版日期:2018-07-10 发布日期:2019-01-08
作者简介:王爱珍(1976-),女,山西静乐,硕士,副教授,研究方向为信息信号处理、通信系统物理层设计。
基金资助:
山西省高等学校教学改革创新项目(J2016097)

Research on Software Reliability Based on Test Effort and Imperfect Debugging

Wang Aizhen¹, Lü Xun²

1. Xinzhou Teachers University, Xinzhou 034000, China;
2. Harbin Engineering University, Harbin 150001, China

Received:2017-05-17 Online:2018-07-10 Published:2019-01-08

摘要/Abstract

摘要： 为了进一步提升软件可靠性模型的拟合能力,在建立软件可靠性模型的过程中同时考虑了非完美调试和测试工作量两个因素。通过比较几种现有的S-型测试工作量函数的仿真结果,选择一种性能最好的测试工作量函数,并结合非完美调试的软件可靠性模型,建立新的模型。进而在两组公开发表的数据集上对新模型进行验证,说明了基于非完美调试和考虑测试工作量的软件可靠性模型的拟合能力优于若干已有的软件可靠性模型。

关键词: 软件可靠性模型, 非完美调试, 测试工作量, S-型

Abstract: To further improve the fitting performance of the software reliability models, imperfect debugging and test effort were considered in the progress of establishing the model of software reliability. The best performance test effort function was selected from some kinds of existing S-type functions through the method of simulation. The influences of test effort were considered in the software reliability model with imperfect debugging. The new model was established. Two groups of public data were used to verify the ability of the new model. The test results showed that the software reliability growth model considering test effort under imperfect debugging had better fitting performance. Meanwhile, the software reliability model with test coverage was also discussed.

Key words: software reliability models, imperfect debugging, test effort, S-type

中图分类号:

TP.391.9

王爱珍, 吕勋. 基于非完美调试和测试工作量的软件可靠性研究[J]. 系统仿真学报, 2018, 30(7): 2593-2599.

Wang Aizhen, Lü Xun. Research on Software Reliability Based on Test Effort and Imperfect Debugging[J]. Journal of System Simulation, 2018, 30(7): 2593-2599.

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基于非完美调试和测试工作量的软件可靠性研究

Research on Software Reliability Based on Test Effort and Imperfect Debugging

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