[1] 臧克茂. 陆战平台全电化技术研究综述[J]. 装甲兵工程学院学报, 2011, 25(1): 1-7. [2] 黄根全. 航空电源故障特征提取与故障诊断研究 [D]. 西安: 西北工业大学, 2005. [3] Saha B, Vachtsevanos G.A model-based reasoning approach to system fault diagnosis[J]. WSEAS Transactions on Systems (S1109-2777), 2006, 5(8): 1997-2004. [4] Siddiqui A A, Haibin Y, QingHua Y, et al. PHM for air craft power supply generators using real-time frequency estimation based on 3-line DFT[C]// Industrial Electronics and Applications (ICIEA), 2011 6th IEEE Conference on. USA: IEEE, 2011: 2548-2551. [5] Saha S, Celaya J R, Vashchenko V, et al. Accelerated aging with electrical overstress and prognostics for power mosfets[C]// Energytech, 2011 IEEE. USA: IEEE, 2011: 1-6. [6] Celaya J R, Saxena A, Vashchenko V, et al. Prognostics of power MOSFET[C]// Power Semiconductor Devices and ICs (ISPSD), 2011 IEEE 23rd International Symposium on. USA: IEEE, 2011: 160-163. [7] 吴祎, 王友仁, 姜媛媛, 等. 基于特征参数退化的 DC/DC 变换器故障预测[J]. 仪器仪表学报, 2013, 34(6): 1380-1387. [8] 姜媛媛, 王友仁, 罗慧, 等. 电力电子电路故障评估新指标及基于LSSVM 的预测新方法[J]. 电工技术学报, 2012, 27(12): 43-50. [9] Zhai G, Zhou Y, Ye X, et al. A method of multi-objective reliability tolerance design for electronic circuits[J]. Chinese Journal of Aeronautics (S1000-9361), 2013, 26(1): 161-170. [10] 尚永爽, 王怡苹, 刘勇. 开关电源的故障预测及电解电容器退化研究[J]. 电子测量技术, 2010, 33(11): 102-104. [11] Judkins J, Goodman D, Vonhout S.Practical considerations for power electronics system and actuator prognostics implementations[C]// Autotestcon, 2007 IEEE. USA: IEEE, 2007: 553-560. [12] 陈世杰. 功率MOSFET退化建模及寿命预测方法研究 [D]. 哈尔滨: 哈尔滨工业大学, 2013. [13] Orsagh R, Brown D, Roemer M, et al. Prognostic health management for avionics system power supplies[C]// Aerospace Conference, 2005 IEEE. USA: IEEE, 2005: 3585-3591. [14] Cester A, Gerardin S, Paccagnella A, et al. Modeling MOSFET and circuit degradation through SPICE[C]// Solid-State Device Research Conference, 2005 IEEE. USA: IEEE, 2005: 403-406. [15] 周慧德. 开关电源中铝电解电容可靠性的研究 [D]. 哈尔滨: 哈尔滨工业大学, 2010. |